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Although the 4200-CVU capacitance option for Keithley’s Model 4200 Semiconductor Characterization System does not measure inductance directly, users can easily extract the inductance from the parameters it does measure: impedance (Z), phase angle (theta or θ), and the test frequency (f). This application note describes how users of the Model 4200-SCS can determine nductance using the 4200-CVU option. 下載： 
201401125.pdf
(148.78 KB)
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